Method of performing electrostatic discharge testing on a payment card

ABSTRACT

Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.

CROSS-REFERENCES TO RELATED APPLICATIONS

This application is a divisional of U.S. patent application Ser. No.12/016,947 filed Jan. 18, 2008, entitled “Methods of PerformingElectrostatic Discharge Testing on a Payment Card.”, which claimspriority to U.S. Provisional Application Ser. No. 60/885,764 filed Jan.19, 2007, entitled, “Methods of Performing Electrostatic Discharge,”both of which are hereby incorporated by reference herein for allpurposes.

BACKGROUND

Electrostatic discharge (ESD) is a sudden and momentary electric currentthat occurs when an excess of electric charge stored on an electricallyinsulated or non-insulated object flows to an object at a differentelectrical potential, such as ground. ESD is a serious issue in solidstate electronics, particularly when a momentary unwanted current causesdamage to electronic equipment.

One type of object on which electric charge can accumulate is atransaction card, such as a credit card, debit card, smart card,contactless card, loyalty card, payment card and the like. Such cardsare typically brought into contact with electronic devices, such aspoint of sale terminals. Accordingly, if an electric charge has built upon a transaction card, electrostatic discharge from the card into theelectronic device can damage the device. In some cases, ESD can causethe electronic device to fail to perform a payment transaction.

Such cards can also act as a conduit between objects having differentelectrical potentials, such as a user's body and a payment card readerdevice. Transaction cards are typically brought into contact withelectronic devices, such as point of sale terminals, and provide aconduit between an electrically charged user's body and a card readerdevice. As such, if an electric charge has been generated on the user'sbody and/or other objects, an electrostatic discharge may be generatedfrom the user into the electronic device through the user's skin, thecard and the card's conductive elements while the card is in contactwith the card reading device. Such electrostatic discharge can damagethe device. In some cases, the electrostatic discharge can cause theelectronic device to fail to perform a payment transaction eithertemporarily or permanently.

As such, methods of determining the amount of ESD emitted by atransaction card and methods of determining whether the amount ofdischarged electrical charge could cause damage to an electronic devicewould be desirable.

BRIEF SUMMARY

Before the present embodiments, methods, and materials are described, itis to be understood that this disclosure is not limited to theparticular embodiments, methodologies, and materials described, as thesemay vary. It is also to be understood that the terminology used in thedescription is for the purpose of describing the particular embodimentsonly, and is not intended to limit the scope.

It must also be noted that as used herein and in the appended claims,the singular forms “a,” “an,” and “the” include plural references unlessthe context clearly dictates otherwise. Thus, for example, reference toa “card” is a reference to one or more cards and equivalents thereofknown to those skilled in the art, and so forth. Unless definedotherwise, all technical and scientific terms used herein have the samemeanings as commonly understood by one of ordinary skill in the art.Although any methods, materials, and devices similar or equivalent tothose described herein can be used in the practice or testing ofembodiments, the preferred methods, materials, and devices are nowdescribed. All publications mentioned herein are incorporated byreference in their entireties. Nothing herein is to be construed as anadmission that the embodiments described herein are not entitled toantedate such disclosure by virtue of prior invention. As used herein,the term “comprising” means “including, but not limited to.”

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include placing a transaction card on aninsulated surface, placing a grounding probe at a first location on thetransaction card, charging a discharge probe to a known voltage level,discharging the discharge probe at a second location on the transactioncard, recording a discharge wave shape from the ground probe, andassigning one of a pass condition and a fail condition to thetransaction card based on at least the value of the known voltage levelas compared to a reference voltage level. The first location and thesecond location may each be selected from a plurality of areas on thetransaction card.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include placing a transaction card having amagnetic stripe on an insulated surface, placing a grounding probe onthe magnetic stripe along a first edge of the transaction card, charginga discharge probe to a known voltage level, discharging the dischargeprobe on the magnetic stripe along a second edge, which is opposite thefirst edge, of the transaction card, recording a discharge wave shapefrom the ground probe, and assigning one of a pass condition and a failcondition to the transaction card at least based on whether thedischarge wave shape is substantially similar to a reference dischargewave shape.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include connecting a read head, comprising ashell and one or more pins, to a ground voltage level, charging adischarge probe to a known voltage level, discharging, at a firstlocation on the transaction card, the discharge probe onto a transactioncard held by an operator to charge the transaction card and the operatorto the known voltage level, placing the transaction card in contact withthe read head at a second location on the transaction card, recording adischarge wave shape from the ground probe, and assigning one of a passcondition and a fail condition to the transaction card based on at leastthe value of the known voltage level as compared to a reference voltagelevel. The first location and the second location may each be selectedfrom a plurality of areas on the transaction card.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include charging a discharge probe to a knownvoltage level, discharging, at a first location on the transaction card,the discharge probe onto a transaction card held by an operator tocharge the transaction card and the operator to the known voltage level,placing the transaction card in contact with a read head of a terminalat a second location on the transaction card, determining whether theterminal exhibits an abnormality, and, if so, assigning one of a passcondition and a fail condition to the transaction card based on at leastthe value of the known voltage level as compared to a reference voltagelevel.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include charging a discharge probe to a knownvoltage level, discharging, at a first location on the transaction card,the discharge probe onto a transaction card held by an operator tocharge the transaction card and the operator to the known voltage level,placing the transaction card in contact with a read head of a terminalat a second location on the transaction card, recording a peak voltageand a voltage wave shape at the read head, and assigning one of a passcondition and a fail condition to the transaction card based on at leastthe value of the known voltage level as compared to a reference voltagelevel.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include charging a transaction card to a knownvoltage level, swiping the transaction card through a terminal, andassigning one of a pass condition and a fail condition to thetransaction card based on whether an abnormality occurs.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include charging a magnetic stripe on atransaction card to a known voltage level, swiping the transaction cardthrough a terminal, and assigning one of a pass condition and a failcondition to the transaction card based on whether an abnormalityoccurs.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include rubbing the transaction card against aconductive material, swiping the transaction card through a terminal,and assigning one of a pass condition and a fail condition to thetransaction card based on whether an abnormality occurs.

In an embodiment, a method of performing electrostatic discharge testingon a transaction card may include placing the transaction card on ametal surface such that a first side of the transaction card contactsthe metal surface and a second side, having a magnetic stripe andopposite the first side, does not contact the metal surface, determininga capacitance for the transaction card, assigning one of a passcondition and a fail condition to the transaction card based on whetherthe capacitance exceeds a threshold value.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects, features, benefits and advantages of the present invention willbe apparent with regard to the following description and accompanyingdrawings, of which:

FIGS. 1A and 1B depict exemplary test zones for card edge measurementsaccording to an embodiment.

FIG. 2 depicts an exemplary test zone for card component measurementsaccording to an embodiment.

FIG. 3 depicts exemplary test zones for card edge to componentmeasurements according to an embodiment.

FIG. 4 depicts a first exemplary test setup for performing a testaccording to an embodiment.

FIG. 5 depicts an exemplary method for performing an ESD waveform andmagnitude with dielectric breakdown test according to an embodiment.

FIG. 6 depicts a second exemplary test setup for performing a testaccording to an embodiment.

FIG. 7 depicts an exemplary method for performing an ESD waveform andmagnitude with conductivity test according to an embodiment.

FIG. 8 depicts a third exemplary test setup for performing a testaccording to an embodiment.

FIG. 9 depicts an exemplary method for performing an ESD on a groundedread head test according to an embodiment.

FIGS. 10A and 10B depict a fourth exemplary test setup for performing atest according to an embodiment.

FIG. 11 depicts an exemplary method for performing a simulated dischargevia a human body test according to an embodiment.

FIGS. 12A and 12B depict a fifth exemplary test setup for performing atest according to an embodiment.

FIG. 13 depicts an exemplary method for performing a conductivity testaccording to an embodiment.

FIG. 14 depicts an exemplary method for performing atriboelectrification simulation via charge plate test according to anembodiment.

FIG. 15 depicts an exemplary method for performing a charged cardsimulation test according to an embodiment.

FIG. 16 depicts an exemplary method for performing a card charging leveltest according to an embodiment.

FIG. 17 depicts an exemplary method for performing a card capacitanceand discharge energy test according to an embodiment.

DETAILED DESCRIPTION

As used herein, an unidentified component refers to a component on atransaction card for which ESD testing has not previously beenperformed.

One or more tests may be performed to assist in identifying anyinterruption of payment transactions caused by transaction cards,particularly those with unidentified components and elements. Inaddition, such tests may identify potential damage that could resultwhen the transaction card is introduced into a terminal. In anembodiment, any element of a transaction card that indicates electricalattributes that differ from a magnetic stripe may be considered anunidentified component for the purposes of this test. Transaction cardcomponents that may be considered unidentified components may include,but are not limited to, a card's self-powering circuitry, displays,sensors, holograms or any other visual component in or on a transactioncard.

The one or more tests may provide a basis for identifying anyinterruption to a transaction in a device normal process caused by atransaction card with unidentified components. The tests may compare theperformance of a transaction card with unidentified elements against theperformance of a carbon-based magnetic stripe card in terms ofelectrical attributes during an ESD event on the card. In an embodiment,if the transaction card with unidentified elements performssubstantially equivalently to the carbon-based magnetic stripe card, thetransaction card with unidentified elements may be considered to havepassed the test.

For example, three test set-ups may be used to test a new transactioncard: 1) an ESD model and magnitude comparison via a specially designedtest setup not including a terminal, 2) an ESD magnitude and polaritycomparison performed using a terminal read head, and 3) determining thevoltage level developed on the transaction card when rubbed againstanother card, leather, nylon, cotton and/or other common clothingmaterials in order to provide an indication of the voltage levels andpolarity of electric charge that develops on a transaction card duringnormal handling.

Based on the performance of a transaction card under a plurality of testconditions, a recommendation, in terms of the expected outcome of an ESDevent occurrence for the card, may be provided. For example, if thetransaction card performs substantially similarly to a carbon-basedmagnetic stripe card on all tests, the transaction card may beconsidered unlikely to cause a damaging ESD event. The performance of acarbon-based magnetic stripe card may be selected as a reference pointbecause no reported incidents of terminal malfunction from ESD haveoccurs during more than 30 years using such cards.

Models for performing an ESD test may include one or more of thefollowing: 1) IEC 61000-4-2 (Person holding a tool—150 pF/330 Ohms), 2)ANSI/ESD STM 5.1-2001 (Human Body Model—100 pF/1500 Ohms), 3) ANSI/ESDSTM 5.2-1999 (Machine Model—200 pF/0 Ohms), and 4) ANSI/ESD STM 5.3(Charged Device Model—Stripe capacitance/0 Ohms).

ISO 7810 is an international standard that defines three form factorsfor identity or identification cards: ID-1 (approximately 8.56 cm byapproximately 5.4 cm), ID-2 (approximately 10.5 cm by approximately 7.4cm), and ID-3 (approximately 12.5 cm by approximately 8.8 cm). The ID-1form factor is often used for transaction cards, although other cardform factors, including form factors not defined in ISO 7810, may beincluded within the scope of this disclosure.

Different zones may be defined on a transaction card for testingpurposes. A first zone (“Zone 1”) may identify “unsafe” areas in which amagnetic stripe terminal read head directly contacts the card during anormal swipe or an upside-down swipe. The first zone may also representthe portion of the card that is held by a user when a card is swiped. Assuch, measurements may be made along a line between a first point thatis 1 cm in from a first long card edge and 1 cm in from a first shortcard edge and a second point that is 1 cm in from the first long cardedge and 1 cm in from a second short card edge on the front of the card(“Test Zone 1F”). A similar line defined by points measured from asecond long card edge may also be measured (“Test Zone 2F”). Inaddition, the measurements may be performed on the back of the card(“Test Zones 1B and 2B”). The above-defined exemplary Test Zones forZone 1 (i.e., Test Zones 1F, 2F, 1B and 2B) are depicted in FIGS. 1A and1B.

A Safe Zone may be defined for a transaction card. The Safe Zone may bethe area that is at least approximately 1.9 cm in from each of the twolong edges and 1.9 cm in from each of the two short edges, as shown inFIG. 2. If an unidentified component is at least partially outside ofthe Safe Zone, two additional zones may be defined.

A second zone (“Zone 2”) may be defined for on-component measurements.The second zone may be defined as a line from a first point that isapproximately 0.5 cm inside a first short edge of the component to asecond point that is approximately 0.5 cm inside a second short edge ofthe component. In an embodiment, the first and second points may beapproximately halfway between the two long edges of the component. Anexemplary second zone is depicted in FIG. 2.

A third zone (“Zone 3”) may be defined by the points defined for Zone 1and the points defined for Zone 2. The third zone may include the linesdefined by each combination of Zone 1 points and Zone 2 points (8 totallines). An exemplary set of lines defining a third zone is depicted inFIG. 3.

Additional and/or alternate zones for testing may be used. For example,points at different distances from the edge of a transaction card may beselected. In addition, more or fewer points may be selected for each ofthe one or more zones. Such modifications will be apparent to those ofordinary skill in the art based on this disclosure.

For each test described below, one or more test conditions may berequired to be satisfied in order to ensure reproducibility andreliability of the performed test. For example, the test environment maybe required to have equal to or less than approximately 20% relativehumidity. Furthermore, the transaction cards to be tested (and anycontrol cards for pass and/or fail conditions) may be stored in anenvironment having approximately 12% relative humidity for at least 24hours with enforced air around the cards. Testing personnel may berequired to stand on an insulative substrate, such aspolytetrafluoroethylene (Teflon® from E. I. du Pont de Nemours and Co.),polymethyl methacrylate (Plexiglas® from Rohm and Haas Co.) and/orpolyethylene foam in order to prevent grounding. Additional and/oralternate test conditions may be imposed.

Each test may be performed with a plurality of test transaction cardsand a plurality of control transaction cards. The test transaction cardsmay comprise a transaction card design that is being tested. The controltransaction cards may include carbon-based magnetic stripe cards used asa reference for pass criteria. In an embodiment, the control transactioncards may include cards known to fail in operation, such as cards of aparticular manufacture that discharge an amount of electrostatic energythat causes a terminal device to malfunction during operation undercircumstances equivalent or similar to those being tested.

In an embodiment, one or more pass criteria may be defined for a test.For example, one criterion may be that the current discharged by thetransaction card being tested must be less than approximately 500 mAwhen the transaction card is charged to approximately 5 kV. Anothercriterion may require the transaction card being tested to have acapacitance less than approximately 1 pF. Yet another criterion may bethat the dynamic resistance for the transaction card being tested mustbe greater than approximately 1 ka Still another criterion may requirethat the discharge energy from the transaction card being tested be lessthan approximately 2 μJ. Another criterion may require that nodisruption occur on ESD sensitive terminals used during charge and swipetests. Yet another criterion may require that all cards being testedremain functional, including all visual component and/or transactioninterface functionality, if any, after the test is completed. Additionaland/or alternate criteria, including different values where applicable,may be used within the scope of this disclosure as will be apparent toone of ordinary skill in the art.

FIG. 4 depicts a first exemplary test setup for performing a testaccording to an embodiment. As shown in FIG. 4, a card to be tested 405may be placed on an insulative layer 410. A grounding probe 415 may beplaced on the card 405 at a first test point, and a discharge probe 420may be placed on the card at a second test point. The grounding probe415 may be connected to ground and may be used to capture, for example,a current waveform, if any, when an ESD event occurs. The dischargeprobe 420 may be used to generate an ESD event at a known voltage level.

FIG. 5 depicts an exemplary method for performing an ESD waveform andmagnitude with dielectric breakdown test according to an embodiment. Asshown in FIG. 5, environmental conditions, such as the relative humidityand the temperature, may be recorded 505 prior to, during and/or afterthe test. A card 405 may be placed on the insulated surface 410 suchthat one stripe edge contacts 510 the grounding probe 415 at the firsttest point. The discharge probe 420 may be configured 515 to the HumanBody Model. In an embodiment, the discharge probe 420 may have anadjustable voltage level. For example, the discharge probe 420 mayinitially be set 520 to a known voltage level, such as approximately 500V. The discharge probe 420 may then be discharged 525 at the second testpoint. In an embodiment, the first and second test points may beselected based on one of the Test Zones defined by, for example, Zones1, 2 and 3.

The ground line (i.e., the grounding probe 415) may be examined 530during electrostatic discharge from the discharge probe 420 to determine535 whether a discharge event occurs (i.e., to determine whether thecurrent level is non-zero during the discharging of the dischargeprobe). If a discharge event occurs, the voltage level (V_(EST)), thepeak current and/or the discharge wave shape of the current may berecorded 540. Otherwise, the voltage level of the discharge probe 420may be increased 545 to a different voltage level, such as, for example,approximately 1 kV, 5 kV, 10 kV, 15 kV or 20 kV. Alternate and/oradditional voltage levels for the discharge probe 420 may also be usedwithin the scope of this disclosure. After the voltage level for thedischarge probe 420 is increased 545, the discharge probe may again bedischarged 525. In an embodiment, a period of time, such as at leastapproximately 2 minutes, may be required to elapse before the dischargeprobe 420 is discharged 525 at the increased voltage level.

If a discharge event occurs or no discharge event occurs at a maximumtest voltage level, a new card 405 may be selected 550 for testing. Inan embodiment, a plurality of test cards and a plurality of controlcards may be tested. In an embodiment, the plurality of control cardsmay include a plurality of pass criteria cards and a plurality of failcriteria cards. In an embodiment, the test may be performed for eachTest Zone defined by Zones 1, 2 and 3 for each card 405. In anembodiment, a test card 405 may be considered to pass the test ifV_(ESD) of the test card is comparable to V_(ESD) of the pass criteriacard and if no significant difference is noted between the dischargewave shape of the test card and the discharge wave shape of the passcriteria card. Additional and/or alternate criteria, including differentvalues where applicable, may be used within the scope of this disclosureas will be apparent to one of ordinary skill in the art.

FIG. 6 depicts a second exemplary test setup for performing a testaccording to an embodiment. As shown in FIG. 6, a card to be tested 405may be placed on an insulative layer 410. A grounding probe 415 may beplaced on the card 405 at a first test point, and a discharge probe 420may be placed on the card at a second test point. The grounding probe415 may be connected to ground and may be used to capture, for example,a current waveform, if any, when an ESD event occurs. The dischargeprobe 420 may be used to generate an ESD event at a known voltage level.The first test point may be along the edge of the card 405 and touchingthe magnetic stripe of the card. The second test point may be along theopposing edge of the card 405 and touching the magnetic stripe of thecard.

FIG. 7 depicts an exemplary method for performing an ESD waveform andmagnitude with conductivity test according to an embodiment. As shown inFIG. 7, environmental conditions, such as the relative humidity and thetemperature, may be recorded 705 prior to, during and/or after the test.A card 405 may be placed on the insulated surface 410 such that onestripe edge contacts 710 the grounding probe 415 at the first testpoint. The discharge probe 420 may be configured 715 to the Human BodyModel. In an embodiment, the resistance of the discharge probe 420 maybe adjustable. For example, the discharge probe 420 may initially be set720 to approximately 1500Ω. In addition, the voltage level of thedischarge probe 420 may be set 720 to approximately 5 kV. The dischargeprobe 420 may then be discharged 725 at the second test point. Thedischarge current may be observed 730 by examining a current waveform atthe grounding probe 415. In an embodiment, the peak current and currentwaveform caused by the ESD discharge from the discharge probe 420 may bedetermined. The dynamic resistance may be calculated 735 by dividing thevoltage level of the discharge probe 420 by the peak current in amps.The test may then be repeated with a resistance of approximately 0Ω forthe discharge probe 420. Additional and/or alternate resistance levelsand voltage levels for the discharge probe 420 may be used within thescope of this disclosure. The test may be repeated for each card 405 tobe tested at each resistance level.

FIG. 8 depicts a third exemplary test setup for performing a testaccording to an embodiment. As shown in FIG. 8, a card to be tested 405may be placed on an insulative layer 410. A terminal read head 805 maybe placed on the card 405 at a first test point, and a discharge probe420 may be placed on the card at a second test point. The terminal readhead 805 may be connected to ground via a ground line and may be used tocapture, for example, current waveforms, if any, when an ESD eventoccurs. Current waveforms may be captured, for example, from a pin andthe shell of the terminal read head 805. The discharge probe 420 may beused to generate an ESD event at a known voltage level.

FIG. 9 depicts an exemplary method for performing an ESD on a groundedread head test according to an embodiment. As shown in FIG. 9,environmental conditions, such as the relative humidity and thetemperature, may be recorded 905 prior to, during and/or after the test.A card 405 may be placed on the insulated surface 410. The voltage levelof the discharge probe 420 may be adjustable. For example, the dischargeprobe 420 may initially be set 910 to approximately −5 kV. When placingthe discharge probe 420 on the card 405, the discharge probe may beplaced 915 at a first test point. A test operator may hold the card 405and touch the surface 410 when the discharge probe 420 is placed 915 atthe first test point in order to charge the card and the operator to thesame output potential. The terminal read head 805 may then be placed 920on the card 405 at a second test point. In an embodiment, the first andsecond test points may be selected based on one of the Test Zonesdefined by, for example, Zones 1, 2 and 3.

The ground line connected to the shell of the terminal read head 805 maybe examined 930 during discharge 925 from the discharge probe 420 todetermine 935 whether a discharge event occurs (i.e., to determinewhether the current level is non-zero during the discharging of thedischarge probe). If a discharge event occurs, the voltage level(V_(ESD1), the peak current and/or the discharge wave shape of thecurrent at a pin of the terminal read head 805 and/or the voltage levelof the shell of the terminal read head 805 (V_(ESD2)) may be recorded940. Otherwise, the voltage level of the discharge probe 420 may beincreased 945 to a different voltage level, such as, for example,approximately 1 kV, 2.5 kV, 5 kV or 10 W. Alternate and/or additionalvoltage levels for the discharge probe 420 may also be used within thescope of this disclosure. After the voltage level for the dischargeprobe 420 is increased 945, the discharge probe may again be discharged925. In an embodiment, each test may be performed a plurality of times.In an embodiment, the card 405 may be ionized prior to performing thetest or performing the test at an increased voltage level.

If a discharge event occurs or no discharge event occurs at a maximumtest voltage, a new card 405 may be selected 950 for testing. In anembodiment, a plurality of test cards and a plurality of control cardsmay be tested. In an embodiment, the plurality of control cards mayinclude a plurality of pass criteria cards and a plurality of failcriteria cards. In an embodiment, the test may be performed for eachTest Zone defined by Zones 1, 2 and 3 for each card 405. In anembodiment, a test card 405 may be considered to pass the test ifV_(ESD1) of the test card 405 is comparable to V_(ESD1) of the passcriteria card, if V_(ESD2) of the test card is comparable to V_(ESD2) ofthe pass criteria card, and if no significant difference is notedbetween the discharge waveforms for the test card and the dischargewaveforms for the pass criteria card. Additional and/or alternatecriteria, including different values where applicable, may be usedwithin the scope of this disclosure as will be apparent to one ofordinary skill in the art.

FIGS. 10A and 10B depict a fourth exemplary test setup for performing atest according to an embodiment. As shown in FIGS. 10A and 10B, a card405 may be inserted in a card reader (terminal) 1005 during testing. Thecard 405 may be charged using a discharge probe 420 prior to swiping thecard through the terminal 1005. A first test point, such as on a cardstripe 1010 on the card 405, may contact a terminal read head 1015 todetermine if the charge on the card causes an abnormality to occur withthe terminal 1005. In an embodiment, the card 405 may be held by a testoperator when charged and during testing.

FIG. 11 depicts an exemplary method for performing a simulated dischargevia a human body test according to an embodiment. As shown in FIG. 11,environmental conditions, such as the relative humidity and thetemperature, may be recorded 1105 prior to, during and/or after thetest. The discharge probe 420 maybe charged 1110 to an initial voltagelevel, such as approximately −500 V. A test operator may then hold 1115a card 405 such that the operator contacts the surface and edge of thecard. The test operator may then contact 1120 the card 405 with thedischarge probe 420 to electrostatically charge the card. After the card405 is charged, the discharge probe 420 may be removed from contact withthe card, and the card may be inserted into a terminal 1005 such that atleast a portion of the card's magnetic stripe 1010 contacts 1125 theterminal read head 1015. The test operator may determine 1130 whetherthe terminal 1005 reboots, reinitializes, freezes or exhibits any otherabnormality when the card 405 contacts 1125 the terminal read head 1015.If so, the voltage to which the card 405 was charged (V_(EST)) may berecorded 1135. Otherwise, the voltage level of the card 405 may beincreased 1140 to a different voltage level, such as, for example,approximately 1 kV, 2.5 kV, 5 kV or 10 kV, and the above test may berepeated. In an embodiment, the card 405 may be ionized prior toperforming a subsequent iteration of the test on the card. In anembodiment, a card 405 may be tested a plurality of times when chargedto a particular voltage level. In an embodiment, a plurality of cards405, such as one or more cards to be tested, one or more pass criteriacards and/or one or more fail criteria cards, may be tested 1145. A testcard 405 may be considered to pass if the V_(ESD) of the test card iscomparable to the V_(ESD) of a pass criteria card. Additional and/oralternate criteria, including different values where applicable, may beused within the scope of this disclosure as will be apparent to one ofordinary skill in the art.

FIGS. 12A and 12B depict a fifth exemplary test setup for performing atest according to an embodiment. As shown in FIGS. 12A and 12B, a card405 may be inserted in a terminal 1005 during testing. The card 405 maybe charged using a discharge probe 420 prior to swiping the card throughthe terminal 1005. A first test point, such as a on a card stripe 1010on the card 405, may contact a grounding probe 415 placed within theterminal 1005. In an embodiment, the card 405 may be held by a testoperator when charged and during testing.

FIG. 13 depicts an exemplary method for performing a simulated dischargevia a human body test according to an embodiment. As shown in FIG. 13,environmental conditions, such as the relative humidity and thetemperature, may be recorded 1305 prior to, during and/or after thetest. The discharge probe 420 may be charged 1310 to an initial voltagelevel, such as approximately −500 V. A test operator may then hold 1315a card 405 such that the operator contacts the surface and the edge ofthe card. The test operator may then contact 1320 the card 405 with thedischarge probe 420 to electrostatically charge the card. After the card405 is charged, the discharge probe 420 may be removed from the card,and the card may be inserted into a terminal 1005 such that a portion ofthe card's magnetic stripe 1010 contacts 1325 the grounding probe 415.The peak voltage and voltage and/or current waveforms may be recorded1330 from the grounding probe 415. The voltage level of the card 405 maybe increased 1335 to a different voltage level, such as, for example,approximately 1 kV, 2.5 kV, 5 kV or 10 kV, and the above test may berepeated. In an embodiment, the test may be repeated at increasingvoltages until disruption. In an embodiment, the card 405 may be ionizedprior to performing a subsequent iteration of the test. In anembodiment, a card 405 may be tested a plurality of times at aparticular voltage. In an embodiment, a plurality of cards 405, such asone or more cards to be tested, one or more pass criteria cards and/orone or more fail criteria cards, may be tested 1340. A test card 405 maybe considered to pass if the V_(ESD) of the test card is comparable tothe V_(ESD) of a pass criteria card. Additional and/or alternatecriteria, including different values where applicable, may be usedwithin the scope of this disclosure as will be apparent to one ofordinary skill in the art.

FIG. 14 depicts an exemplary method for performing atriboelectrification simulation via charge plate test according to anembodiment. As shown in FIG. 14, environmental conditions, such as therelative humidity and the temperature, may be recorded 1405 prior to,during and/or after the test. The card 405 may be charged 1410 to avoltage level, such as approximately 30 kV, using, for example, a coronacharging apparatus (not shown). The card 405 may then be swiped 1415 ina terminal. A test operator may determine 1420 whether the terminalreboots, reinitializes, freezes or exhibits any other abnormality whenthe card 405 is swiped 1415. A card voltage level at which the terminalexhibits an abnormality, if any, may be determined 1425. The test card405 may be considered 1430 to fail if an abnormality is exhibited by theterminal. Otherwise, the card may be considered to pass 1435. In anembodiment, the card 405 may be ionized between test iterations. A card405 may be tested using the above process a plurality of times. In anembodiment, a plurality of cards 405, such as one or more cards to betested, one or more pass criteria cards and/or one or more fail criteriacards, may be tested 1440. Additional and/or alternate criteria,including different values where applicable, may be used within thescope of this disclosure as will be apparent to one of ordinary skill inthe art.

FIG. 15 depicts an exemplary method for performing a charged cardsimulation test according to an embodiment. As shown in FIG. 15,environmental conditions, such as the relative humidity and thetemperature, may be recorded 1505 prior to, during and/or after thetest. A magnetic stripe on a card 405 may be charged 1510 to an initialvoltage level, such as approximately −500 V. The card may then be swiped1515 in a terminal. A test operator may determine 1520 whether theterminal reboots, reinitializes, freezes or exhibits any otherabnormality when the card 405 is swiped 1515. If an abnormality occurswith the terminal, the magnetic stripe voltage at which the abnormalityoccurs may be recorded and the card 405 may be considered 1525 to fail.The card 405 may be ionized after being swiped 1515. The test may berepeated a plurality of times for each card 405 at a particular voltagelevel. The magnetic stripe on the card 405 may be charged 1530 to adifferent voltage, such as approximately −1 kV, −2.5 kV, −5 kV, −10 kV,500 V, 1 kV, 2.5 kV, 5 kV or 10 kV, prior to performing the test again.The test card 405 may be considered 1535 to pass if no abnormality isexhibited by the terminal. In an embodiment, a plurality of cards 405,such as one or more cards to be tested, one or more pass criteria cardsand/or one or more fail criteria cards, may be tested 1540. Additionaland/or alternate criteria, including different values where applicable,may be used within the scope of this disclosure as will be apparent toone of ordinary skill in the art.

FIG. 16 depicts an exemplary method for performing a card charging leveltest according to an embodiment. As shown in FIG. 16, environmentalconditions, such as the relative humidity and the temperature, may berecorded 1605 prior to, during and/or after the test. A card 405 may becharged 1610 by rubbing it against, for example and without limitation,another card, leather, nylon, cotton and/or one or more other materials.The card 405 may then be swiped 1615 in a terminal. The terminal mayinclude a simulated read head. Electrostatic discharge waveforms may becaptured 1620, and the peak discharge current may be recorded 1625. Ifthe peak discharge current for the test card 405 is determined 1630 tobe substantially similar to a pass criteria card and/or substantiallydissimilar from a fail criteria card, the test card may be considered1635 to pass. Otherwise, the test card 405 may be considered 1640 tofail. In an embodiment, a plurality of cards 405, such as one or morecards to be tested, one or more pass criteria cards and/or one or morefail criteria cards, may be tested 1645. In an embodiment, each card 405may be tested a plurality of times. Additional and/or alternatecriteria, including different values where applicable, may be usedwithin the scope of this disclosure as will be apparent to one ofordinary skill in the art.

FIG. 17 depicts an exemplary method for performing a card capacitanceand discharge energy test according to an embodiment. As shown in FIG.17, environmental conditions, such as the relative humidity and thetemperature, may be recorded 1705 prior to, during and/or after thetest. A card 405 may be placed 1710 such that the side of the card thatdoes not include the magnetic stripe contacts a flat metal surface. Acapacitance meter (not shown) may be connected to the flat metal surfaceand the stripe of the card 405 to measure 1715 the capacitance of thecard. The discharge energy for the card 405 may be calculated 1720using, for example, the following equation:

${E = {\frac{{CV}^{2}}{2} = {6.25 \times 10^{6}C}}},$

where C is the capacitance for the card. It may then be determined 1725whether the card capacitance is less than a threshold value, such asapproximately 1 pF. If so, the test card 405 may be considered 1730 topass. Otherwise, the test card 405 may be considered to fail 1735. Thetest may be repeated 1740 for each card to be tested. Additional and/oralternate criteria, including different values where applicable, may beused within the scope of this disclosure as will be apparent to one ofordinary skill in the art.

It will be appreciated that various of the above-disclosed and otherfeatures and functions, or alternatives thereof, may be desirablycombined into many other different systems or applications. Also, itwill be appreciated that various presently unforeseen or unanticipatedalternatives, modifications, variations or improvements therein may besubsequently made by those skilled in the art that. Such alternatives,modifications, variations and improvements are also intended to beencompassed by the following claims.

1. A method of performing electrostatic discharge testing on atransaction card, the method comprising: charging a discharge probe to aknown voltage level; discharging, at a first location on the transactioncard, the discharge probe onto a transaction card held by an operator,to charge the transaction card and the operator to the known voltagelevel; placing the transaction card in contact with a read head of aterminal at a second location on the transaction card; determiningwhether the terminal exhibits an abnormality; and if so, assigning oneof a pass condition and a fail condition to the transaction card basedon at least the value of the known voltage level as compared to areference voltage level.
 2. The method of claim 1 wherein theabnormality comprises one or more of rebooting the terminal,reinitializing the terminal, and suspending operation of the terminal.3. The method of claim 1 wherein the first location comprises a firstpoint on a magnetic stripe of the transaction card approximately 0.5 cmfrom a first edge of the transaction card, wherein the second locationcomprises a second point on the magnetic stripe approximately 0.5 cmfrom a second edge of the transaction card, wherein the second edge ofthe transaction card is opposite the first edge of the transaction card.4. The method of claim 1 wherein the known voltage level comprises avoltage level between approximately −1000 volts and approximately 10000volts.
 5. The method of claim 1 wherein the reference voltage level isbased on a voltage at which a carbon-based magnetic stripe card fails.6. A method of performing electrostatic discharge testing on atransaction card, the method comprising: charging a discharge probe to aknown voltage level; discharging, at a first location on the transactioncard, the discharge probe onto a transaction card held by an operator tocharge the transaction card and the operator to the known voltage level;placing the transaction card in contact with a read head of a terminalat a second location on the transaction card; recording a peak voltageand a voltage wave shape at the read head; and assigning one of a passcondition and a fail condition to the transaction card based on at leastthe value of the known voltage level as compared to a reference voltagelevel.
 7. The method of claim 6 wherein the first location comprises afirst point on a magnetic stripe of the transaction card approximately0.5 cm from a first edge of the transaction card, wherein the secondlocation comprises a second point on the magnetic stripe approximately0.5 cm from a second edge of the transaction card, wherein the secondedge of the transaction card is opposite the first edge of thetransaction card.
 8. The method of claim 6 wherein the known voltagelevel comprises a voltage level between approximately −1000 volts andapproximately 10000 volts.
 9. The method of claim 6 wherein thereference voltage level is based on a voltage at which a carbon-basedmagnetic stripe card fails.
 10. A method of performing electrostaticdischarge testing on a transaction card, the method comprising: charginga transaction card to a known voltage level; swiping the transactioncard through a terminal; and assigning one of a pass condition and afail condition to the transaction card based on whether an abnormalityoccurs in the terminal.
 11. The method of claim 10 wherein theabnormality comprises one or more of rebooting the terminal,reinitializing the terminal, and suspending operation of the terminal.12. The method of claim 10 wherein the known voltage comprisesapproximately 30000 volts.
 13. A method of performing electrostaticdischarge testing on a transaction card, the method comprising: charginga magnetic stripe on a transaction card to a known voltage level;swiping the transaction card through a terminal; and assigning one of apass condition and a fail condition to the transaction card based onwhether an abnormality occurs in the terminal.
 14. The method of claim13 wherein the abnormality comprises one or more of rebooting theterminal, reinitializing the terminal, and suspending operation of theterminal.
 15. The method of claim 13 wherein the known voltage comprisesa voltage level between approximately −10000 volts and approximately10000 volts.
 16. A method of performing electrostatic discharge testingon a transaction card, the method comprising: rubbing the transactioncard against a conductive material; swiping the transaction card througha terminal; and assigning one of a pass condition and a fail conditionto the transaction card based on whether an abnormality occurs in theterminal.
 17. The method of claim 16 wherein the conductive materialcomprises one or more of a plastic, leather, nylon, and cotton.
 18. Themethod of claim 16 wherein the abnormality comprises one or more ofrebooting the terminal, reinitializing the terminal, and suspendingoperation of the terminal.
 19. The method of claim 16 wherein swipingthe transaction card through a terminal comprises placing thetransaction card in contact with a read head of a terminal, and furthercomprising: recording a peak voltage and a voltage wave shape at theread head.
 20. A method of performing electrostatic discharge testing ona transaction card, the method comprising: placing the transaction cardon a metal surface such that a first side of the transaction cardcontacts the metal surface, wherein a second side comprises a magneticstripe, wherein the second side is opposite the first side and does notcontact the metal surface; determining a capacitance for the transactioncard; assigning one of a pass condition and a fail condition to thetransaction card based on whether the capacitance exceeds a thresholdvalue.
 21. The method of claim 20 wherein determining a capacitance forthe transaction card comprises: connecting a first probe of acapacitance meter to the metal surface; and connecting a second probe ofthe capacitance meter to the magnetic stripe.
 22. The method of claim 20wherein the threshold value comprises approximately 1 pF.